{"id":472,"date":"2015-02-06T20:33:18","date_gmt":"2015-02-06T20:33:18","guid":{"rendered":"http:\/\/www.testprobes.nl\/testprobes\/wordpress\/?page_id=472"},"modified":"2026-02-03T11:04:34","modified_gmt":"2026-02-03T10:04:34","slug":"ict-fixture-toebehoren","status":"publish","type":"page","link":"https:\/\/www.designedfortest.com\/DFT\/ict-fixture-toebehoren\/","title":{"rendered":"ICT Test Fixture toebehoren"},"content":{"rendered":"
\n
\"Opens
Opens Test Probe.<\/figcaption><\/figure>\n<\/div>\n\n\n

Opens Testing Products voor ICT Test Fixtures.<\/span><\/b><\/span><\/h1>\n\n\n\n

Since some time already, US companies originally had\u00a0developed\u00a0vectorless test techniques for detecting open pins on component packages and\u00a0connectors. HP \/ Agilent developed TestJet and VTEP Parts, Genrad OpenXpress, DigitalTest OpensTest and Teradyne Framescan plus and FX2.0.
In addition to these developments ECT developed their Hanger probes. The compliant motion of the ECT Hanger probes is perfect for use with non level or non parallel applications. By lessening the side forces, there is less opportunity for damage to the sensors under test.<\/p>\n\n\n\n

\n
\"Opens
Opens test probes Old Style<\/figcaption><\/figure>\n\n\n\n
\"Opens
Opens test probes New Style<\/figcaption><\/figure>\n<\/figure>\n\n\n\n

Conventional probes cause stress interference due to non- compliance in the sensor probe combination.
ECT Spring loaded hanger style probes offer compliance during gate opening and closing guaranteeing stress free operation.<\/p>\n\n\n\n

Below you find an overview of the available parts, klick the picture to enlarge it.<\/span><\/b><\/span><\/h2>\n\n\n\n