{"id":3197,"date":"2024-07-25T14:41:39","date_gmt":"2024-07-25T13:41:39","guid":{"rendered":"https:\/\/www.testprobes.nl\/?p=3197"},"modified":"2026-01-27T13:26:08","modified_gmt":"2026-01-27T12:26:08","slug":"new-rf-probes-for-sma-and-direct-pcb-contact","status":"publish","type":"post","link":"https:\/\/www.designedfortest.com\/DFT\/new-rf-probes-for-sma-and-direct-pcb-contact\/","title":{"rendered":"RF (Radio Frequency) probe for SMA and direct PCB contact."},"content":{"rendered":"\n

High Frequency probe for PCBA test.<\/span><\/h1>\n\n\n\n
\"Testprobes-overview\"<\/figure>\n\n\n\n

The high frequency ECT CSP-30TS-011<\/strong> has been designed to perfectly mate with PCBA test pads and vias.<\/span><\/h3>\n\n\n\n

Because there is a high demand for reliable, high performance and cost-efficient Radio Frequency (RF) probe solutions in the PCBA test market, ECT launched these new probes to support high speed, high volume testing.<\/span><\/p>\n\n\n

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\"RF
RF test probe for direct PCB contact<\/span><\/figcaption><\/figure>\n<\/div>\n\n\n

Everett Charles Technologies (ECT) recently added the CSP-30TS-011 to its industry-proven portfolio of high frequency probes for the PCBA test market. This next generation coaxial probe provides instrumentation-quality interface for broadband RF measurements exceeding 20GHz, delivering superior performance while seamlessly mating with pads, vias, and other board features. The CSP-30TS-011 RF probe combines several innovative features to provide a truly reliable and cost-effective testing solution.<\/span>
The CSP-30TS-011 is compatible with other ECT ICT\/FT probes and features an open architecture format that can be configured with up to 4 easy-to-replace ground probes. With an insertion loss (S21) in excess of 20 GHz @ -1dB and a consistent impedance of 50 Ohm, the CSP-30TS-011 offers outstanding signal integrity and measurement capability. The CSP-30TS-011 provides spring-loaded compliance for both the center signal probe and the outer ground probes, while the knurl housing feature allows for easy and reliable press fit mounting.<\/span><\/p>\n\n\n\n

The ECT CSP-30ES-013 probe brings performance and ease-of-use to the next level.<\/span><\/h2>\n\n\n
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\"RF
RF Test probe for SMA connectors<\/figcaption><\/figure>\n<\/div>\n\n\n

The CSP-30ES-013 radio frequency probe mates to standard SMA connectors and combines proven RF performance with ease-of-use to ensure accurate and reliable testing. The CSP-30ES-013 coaxial probe provides an instrumentation-quality interface for broadband RF measurements in excess of 20 GHz, providing a cost-efficient solution for high volume board testing. With the addition of the CSP-30ES-013 high performance radio frequency probe, ECT expands its industry-proven high speed test interface portfolio.<\/span>
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Advantages:<\/h2>\n\n\n\n
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  • The CSP-30ES-013 offers outstanding signal integrity and is capable of bandwidth measurements in excess of 20 GHz @ -1dB<\/strong>. <\/span><\/li>\n\n\n\n
  • With the CSP-30ES-013 RF probe, high frequency and functional tests can be performed in both high volume testing and engineering lab environments.<\/span><\/li>\n\n\n\n
  • Accurate small signal and RF power (50 Watts) measurements provide consistent and repeatable results. <\/span><\/li>\n\n\n\n
  • The CSP-30ES-013 ensures a consistent impedance of 50 Ohm.<\/span><\/li>\n\n\n\n
  • It provides spring-loaded compliance for both the center signal probe and outer housing that provides ground contact. <\/span><\/li>\n\n\n\n
  • The articulated contact allows for targeting errors. <\/span><\/li>\n\n\n\n
  • The CSP-30ES-013 features a rugged design for inline applications and an easy to replace center conductor probe (SPL-30E-030). The knurl housing feature ensures easy and reliable press fit mounting.<\/span><\/li>\n<\/ul>\n\n\n\n