{"id":462,"count":485,"description":"\"Spring<\/a><\/strong>\r\n\r\nClick on the image for more information<\/strong>\r\nECT expands the limits of test technology with innovative RF, battery, and high-current probes that deliver higher quality and better performance.\r\n\r\nTest probe \u2013 test pin \u2013 spring probe \u2013 pogo pin; these are all generic terms to describe a component that traditionally is used to make contact with printed circuit boards (PCBs) or electrical components, in order to test functionality and to measure the value of the components. They are widely used in vacuum or mechanically operated test fixtures associated with automatic test equipment (ATE). They are also used inside a functional test station as part of a larger production line.","link":"https:\/\/www.designedfortest.com\/DFT\/product-categorie\/testprobes\/","name":"ECT Contact Probes - Test Probes","slug":"testprobes","taxonomy":"product_cat","parent":0,"meta":[],"menu_order":0,"yoast_head":"\nECT Contact Probes - Test Probes Archieven - DFT - MG-Products Electronic Test Solutions..<\/title>\n<meta name=\"description\" content=\"Test probes, testpin, prikpen, verende probe, contact probes voor het contacteren van een printplaat welke op een test fixture getest dient te worden.\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.designedfortest.com\/DFT\/product-categorie\/testprobes\/\" \/>\n<meta property=\"og:locale\" content=\"nl_NL\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"ECT Contact Probes - Test Probes Archieven - 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